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NX5402A Silicon Photonics Wafer Test System
One-stop, fully automated and volume production-ready Silicon Photonics wafer test solution with guaranteed system performance
Starting from
Highlights
- One-stop integrated solution with optical/electrical test capabilities for fully-automated wafer prober
- Automated one pass testing for complex and massive optical and electrical measurements
- Volume production-ready with SECS/GEM Factory Automation, safety interlock, and clean room-ready features
- High throughput testing by optimized fiber alignment and multi-channel optical/electrical test architecture
- Guaranteed system performance by Keysight's Advanced Wafer-Level Photonic Calibration
- Dedicated support model enabling high system availability for production
- Keysight-developed Fiber Alignment and Positioning System
- Leading-edge PathWave Semiconductor Test software integrating Keysight SPECS
- Reliable performance monitoring by Build-in Automatic System Diagnostics
- Automated Multi-Recipe Execution software enabling multiple recipes to run in batch mode
Key Specifications
Maximum Number of SPGU output channels
n/a
Maximum Number of Measurement Pins
12 (optical in), 12 (optical out), 30 (electrical)
Minimum Current Measurement Resolution
n/a
Minimum Voltage Measurement Resolution
n/a
Parallel Parametric Test Capability
No
Maximum Number of SPGU output channels
Maximum Number of Measurement Pins
Minimum Current Measurement Resolution
Minimum Voltage Measurement Resolution
Parallel Parametric Test Capability
n/a
12 (optical in), 12 (optical out), 30 (electrical)
n/a
n/a
No
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Additional Features:
n/a
Form Factor:
n/a
Maximum Number of Measurement Pins:
12 (optical in), 12 (optical out), 30 (electrical)
Maximum Number of SPGU output channels:
n/a
Minimum Current Measurement Resolution:
n/a
Minimum Voltage Measurement Resolution:
n/a
Parallel Parametric Test Capability:
No
Type:
Silicon Photonics Wafer Test Solution
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